Ph.D. Dissertation Defense by Sathyanarayanan Raghavan
Drush Site-Install
Title: EXPERIMENTAL AND THEORETICAL STUDY OF ON-CHIP BACK-END-OF-LINE (BEOL) STACK FRACTURE DURING FLIP-CHIP REFLOW ASSEMBLY When: Monday, October 20, 2014 at 9:00 AM Where: MARC Building, Room 201